On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations

Worm, FrédéricIenne, PaoloThiran, PatrickDe Micheli, Giovanni2005-08-082005-08-082005-08-08200410.1109/MDT.2004.96https://infoscience.epfl.ch/handle/20.500.14299/215198WOS:0002250772000085953Robust DesignOn-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variationstext::journal::journal article::research article