Electrical conduction in 10 nm thin polysilicon wires from 4 to 400 K and their operation for hybrid memory

Ecoffey, S.Bouvet, D.Mahapatra, S.Reimbold, G.Ionescu, A. M.2007-05-162007-05-162007-05-16200610.1143/JJAP.45.5461https://infoscience.epfl.ch/handle/20.500.14299/6979WOS:0002408828000219313Electrical conduction in 10 nm thin polysilicon wires from 4 to 400 K and their operation for hybrid memorytext::journal::journal article::research article