Märki, IwanGeissbühler, StefanAguet, FrançoisLasser, Theo2009-07-232009-07-232009-07-23200910.1364/NTM.2009.NMB3https://infoscience.epfl.ch/handle/20.500.14299/41784We show nanometer-level localization accuracy of a single quantum-dot in three dimensions by self-interference and diffraction-pattern analysis. We believe that this approach has the capacity to push optical microscopy to the molecular level.text::conference output::conference proceedings::conference paper