Pavlidis, VasileiosXu, HuDe Micheli, Giovanni2012-07-202012-07-202012-07-20201210.1109/ETS.2012.6233032https://infoscience.epfl.ch/handle/20.500.14299/84078WOS:000309227500033Enhanced Wafer Matching Heuristics for 3-D ICstext::conference output::conference proceedings::conference paper