Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes

Kim, Myun SikScharf, ToralfHerzig, Hans Peter2010-12-132010-12-132010-12-132010https://infoscience.epfl.ch/handle/20.500.14299/62086Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenestext::conference output::conference presentation