New Aspects in Volmer-Weber 3d Growth - an Xps Intensity Study Applied to Thin-Films of Au and Ce on Polypropylene

Heuberger, M.Dietler, G.Schlapbach, L.2007-06-202007-06-202007-06-20199410.1016/0039-6028(94)90209-7https://infoscience.epfl.ch/handle/20.500.14299/9032New Aspects in Volmer-Weber 3d Growth - an Xps Intensity Study Applied to Thin-Films of Au and Ce on Polypropylenetext::journal::journal article::research article