Shot noise and squeezing in the conduction channel of a Field Effect Transistor at ultra-low temperature

Manseau, AnthoniPinsolle, EdouardLupien, ChristianReulet, Bertrand2019-08-232019-08-232019-08-23201910.5075/epfl-ICLAB-ICNF-269301https://infoscience.epfl.ch/handle/20.500.14299/160160Shot noise and squeezing in the conduction channel of a Field Effect Transistor at ultra-low temperaturetext::conference output::conference paper not in proceedings