Auger, V.Eichenberger, N.Akiyama, T.de Rooij, N. F.Siegenthaler, H.Koudelka-Hep, M.2009-05-122009-05-122009-05-122003https://infoscience.epfl.ch/handle/20.500.14299/38976Microfabricated Scanning Probes for ECSTM and SECMtext::conference output::conference proceedings::conference paper