Rupp, DanielaFlueckiger, LeonieAdolph, MarcusColombo, AlessandroGorkhover, TaisHarmand, MarionKrikunova, MariaMueller, Jan PhilippeOelze, TimOvcharenko, YevheniyRichter, MariaSauppe, MarioSchorb, SebastianTreusch, RolfWolter, DavidBostedt, ChristophMoeller, Thomas2020-07-102020-07-102020-07-102020-05-0110.1063/4.0000006https://infoscience.epfl.ch/handle/20.500.14299/169986WOS:000543316900001We have recorded the diffraction patterns from individual xenon clusters irradiated with intense extreme ultraviolet pulses to investigate the influence of light-induced electronic changes on the scattering response. The clusters were irradiated with short wavelength pulses in the wavelength regime of different 4d inner-shell resonances of neutral and ionic xenon, resulting in distinctly different optical properties from areas in the clusters with lower or higher charge states. The data show the emergence of a transient structure with a spatial extension of tens of nanometers within the otherwise homogeneous sample. Simulations indicate that ionization and nanoplasma formation result in a light-induced outer shell in the cluster with a strongly altered refractive index. The presented resonant scattering approach enables imaging of ultrafast electron dynamics on their natural timescale.Chemistry, PhysicalPhysics, Atomic, Molecular & ChemicalChemistryPhysicsimpact energy-transferfree-electron lasersextreme-ultraviolet4d electronsphotoionizationfemtosecondionizationionscoherentdynamicstext::journal::journal article::research article