Lang, T.Thévenaz, LucRen, Z. B.Robert, Ph2008-09-292008-09-292008-09-29199410.1088/0957-0233/5/9/014https://infoscience.epfl.ch/handle/20.500.14299/29860One of the most important parameters in characterization of integrated optical devices is precise determination of the effective cut-off wavelength of the fundamental and first-order modes, since this sets the exact region of single-mode operation. This paper describes an experimental set-up for determination of cut-off wavelengths of integrated optical waveguides, using the technique of spectral light transmission. Measurement results obtained with Ti:LiNbO3 channel waveguides are presented for straight waveguides, bent waveguides and polarizers.Optical variables measurementTitaniumLithium compoundsOptical waveguidesLight transmissionRefractive indexGeometryOptical fibersLight sourcestext::journal::journal article::research article