Depeursinge, ChristianBergoënd, IsabellePavillon, NicolasKühn, JonasColomb, TristanMontfort, FrédéricCuche, EtienneEmery, Yves2009-09-172009-09-172009-09-17200910.1007/978-3-642-03051-2_67https://infoscience.epfl.ch/handle/20.500.14299/42694[MVD]Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopytext::conference output::conference proceedings::conference paper