Feltin, E.Carlin, J. F.Dorsaz, J.Christmann, G.Butte, R.Laugt, M.Ilegems, M.Grandjean, N.2010-10-052010-10-052010-10-05200610.1063/1.2167399https://infoscience.epfl.ch/handle/20.500.14299/55070WOS:000235136700008We report the growth of highly reflective distributed Bragg reflectors (DBRs) in the UV region using the Al0.85In0.15N/Al0.2Ga0.8N lattice-matched system. The DBRs were deposited on nearly strain-free Al0.2Ga0.8N templates to avoid strain-induced structural degradations. The appearance of cracks was then completely suppressed. The DBRs exhibit a reflectivity higher than 99% at a wavelength as short as similar to 340 nm and a stop band width of 215 meV (20 nm). (c) 2006 American Institute of Physics.LIGHT-EMITTING DIODEVAPOR-PHASE EPITAXYGALLIUM NITRIDENMMICROCAVITIESWAVELENGTHGANCONSTANTSPROGRESSALINNCrack-free highly reflective AlInN/AlGaN bragg mirrors for UV applicationstext::journal::journal article::research article