Dehollain, C.Neirynck, J.2004-12-032004-12-032004-12-03199510.1002/cta.4490230203https://infoscience.epfl.ch/handle/20.500.14299/182085WOS:A1995QW39300002Simplified impedance broadband matching by the image parameter method: the RC Casetext::journal::journal article::research article