González, M. T.Wu, S.Huber, R.van der Molen, S. J.Schönenberger, C.Calame, M.2010-03-072010-03-07200610.1021/nl061581ehttps://infoscience.epfl.ch/handle/20.500.14299/47883Electrical Conductance of molecular junctions by a robust statistical analysistext::journal::journal article::research article