Rosenfeld, DSanjines, RLévy, FBuffat, PADemarne, VGrisel, A2007-02-152007-02-152007-02-15199410.1116/1.578909https://infoscience.epfl.ch/handle/20.500.14299/2822WOS:A1994MT40800022Structural and morphological characterization of Nb2O5 thin film deposited by reactive sputteringtext::journal::journal article::research article