Bousse, L.Mostarshed, S.van der Schoot, B.de Rooij, N. F.Gimmel, P.Göpel, W.2009-05-122009-05-122009-05-12199110.1016/0021-9797(91)90130-Zhttps://infoscience.epfl.ch/handle/20.500.14299/39053Zeta Potential Measurements of Ta2O5 and SiO2 Thin Filmstext::journal::journal article::research article