Hocke, FredrikPernpeintner, MatthiasZhou, XiaoqingSchliesser, AlbertKippenberg, Tobias J.Huebl, HansGross, Rudolf2014-11-132014-11-132014-11-13201410.1063/1.4896785https://infoscience.epfl.ch/handle/20.500.14299/108694WOS:000343031700054We investigate the mechanical properties of a doubly clamped, double-layer nanobeam embedded into an electromechanical system. The nanobeam consists of a highly pre-stressed silicon nitride and a superconducting niobium layer. By measuring the mechanical displacement spectral density both in the linear and the nonlinear Duffing regime, we determine the pre-stress and the effective Young's modulus of the nanobeam. An analytical double-layer model quantitatively corroborates the measured values. This suggests that this model can be used to design mechanical multilayer systems for electro- and optomechanical devices, including materials controllable by external parameters such as piezoelectric, magnetostrictive, or in more general multiferroic materials. (C) 2014 AIP Publishing LLC.text::journal::journal article::research article