Hwu, Y.Tsai, W. L.Lai, B.Je, J. H.Fecher, G. H.Bertolo, M.Margaritondo, G.2006-10-032006-10-032006-10-03200110.1016/S0039-6028(01)00834-2https://infoscience.epfl.ch/handle/20.500.14299/234862WOS:0001692858000131704We present several successful test cases of using photoelectron emission microscopy (PEEM) for photon energy up to 25 keV. First, the full extended X-ray absorption fine structure analysis was implemented in areas as small as 100 mum(2) for transition-metal K edge absorption spectra and, therefore, demonstrated the feasibility of combining structural and chemical analysis with hard-X-ray absorption spectroscopy with high lateral resolution. We also show that PEEM can be used in a transmission (radiography) mode as an imaging detector for hard-X-ray, This approach again leads to the unprecedented 0.3 mum lateral resolution, particularly critical for the use of coherence-based phase contrast techniques in real time X-ray radiology. (C) 2001 Elsevier Science B.V. All rights reserved.photoelectron emissionX-ray absorption spectroscopySYNCHROTRON-RADIATIONTHIN-FILMSSPECTROMICROSCOPYCONTRASTRESOLUTIONMEPHISTOSURFACESIMAGEStext::journal::journal article::research article