Alem, N.Louie, S.Zettl, A.Ramasse, Q.Yazyev, O.Seabourne, C.Scott, A.Kisielowski, C.Hartel, P.Jiang, B.Erni, R.2019-08-232019-08-232019-08-23201210.1017/S1431927612009439https://infoscience.epfl.ch/handle/20.500.14299/160179Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Studytext::journal::journal article::research article