Pendlebury, Stephanie R.Barroso, MonicaCowan, Alexander J.Sivula, KevinTang, JunwangGraetzel, MichaelKlug, DavidDurrant, James R.2011-06-082011-06-082011-06-08201110.1039/c0cc03627ghttps://infoscience.epfl.ch/handle/20.500.14299/68532WOS:000285300400027Transient absorption spectroscopy on the mu s-s time scale is used to monitor the yield and decay dynamics of photogenerated holes in nanocrystalline hematite photoanodes. In the absence of a positive applied bias, these holes are observed to undergo rapid electron-hole recombination. The application of a positive bias results in the generation of long-lived (3 +/- 1 s lifetime) photoholes.Carrier DynamicsSolar-CellsPhotoFilmsDynamics of photogenerated holes in nanocrystalline alpha-Fe2O3 electrodes for water oxidation probed by transient absorption spectroscopytext::journal::journal article::research article