Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction

Jager, WLeifer, KEhrhart, PKasper, EKibbel, H2007-02-152007-02-152007-02-151991https://infoscience.epfl.ch/handle/20.500.14299/2735Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffractiontext::conference output::conference proceedings::conference paper