Dimitropoulos, P. D.Drljaca, P. M.Popovic, R. S.Chatzinikolaou, P.2010-11-302010-11-302010-11-30200810.1016/j.sna.2007.11.030https://infoscience.epfl.ch/handle/20.500.14299/61210WOS:000257519100024A completely scalable lumped-circuit model for horizontal HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: (a) geometrical, (b) temperature, and (c) field-dependent mobility effects, as well as for (d) the dynamic response and (e) the noise behavior of several HALL sensors. A series of experimental data is presented along with a review to junction field effect transistor (JFET) operation theory. (c) 2007 Elsevier B.V. All rights reserved.magnetometerHALL effectSpicelumped modelEDA simulatorField-Effect TransistorsVelocity SaturationNumerical-AnalysisCmos TechnologyNoise BehaviorSpiceSensorsFrequenciesFetstext::conference output::conference proceedings::conference paper