Monachon, ChristianWeber, Ludger2014-08-292014-08-292014-08-29201410.1016/j.actamat.2014.04.024https://infoscience.epfl.ch/handle/20.500.14299/106376WOS:000337853100031The thermal boundary conductance (TBC) between thin films of Cr, Mo, Nb and W and diamond substrates has been measured using time domain thermoreflectance before and after a high-vacuum heat treatment at 800 degrees C for 2 h. While no signs of carbide formation could be detected in as-deposited layers by scanning transmission electron microscopy energy dispersive X-ray spectroscopy elemental analysis, the heat treatment led to partial (W,Mo) or full conversion (Cr,Nb) of the film into carbide. The measured TBC values on as-deposited samples of 315, 220, 220 and 205 MW m (-2) K (-1) measured for, respectively, the Cr, Mo, Nb and W samples, were found to not be significantly altered by the heat treatment. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.Time domain thermoreflectanceThermal boundary conductanceMetal matrix compositesRefractory metalsThermal management materialstext::journal::journal article::research article