Piezoresistive Ni:a-C:H thin films containing hcp-Ni or Ni3C investigated by XRD, EXAFS, and wavelet analysis

Uhlig, SteffenStruis, RudolfSchmid-Engel, HannaBock, JochenProbst, Anne-CatherineFreitag-Weber, OliviaZizak, IvoChernikov, RomanSchultes, Günter2013-07-202013-07-202013-07-20201310.1016/j.diamond.2013.01.013https://infoscience.epfl.ch/handle/20.500.14299/93427Piezoresistive Ni:a-C:H thin films containing hcp-Ni or Ni3C investigated by XRD, EXAFS, and wavelet analysistext::journal::journal article::research article