Dotan, HenSivula, KevinGraetzel, MichaelRothschild, AvnerWarren, Scott C.2011-12-162011-12-162011-12-16201110.1039/c0ee00570chttps://infoscience.epfl.ch/handle/20.500.14299/74398WOS:000287924700042We study hematite (alpha-Fe2O3) photoelectrodes for water splitting by examining the fate of photogenerated holes. Using H2O2 as an efficient hole scavenger, we collect all holes that arrive at the electrode/electrolyte interface. This provides the ability to distinguish between and quantify bulk and surface recombination processes involved in the photoelectrochemical oxidation of water. Below 1.0 V-RHE, electrolyte oxidation kinetics limits the performance but above 1.2 V-RHE bulk recombination becomes the limiting factor.Iron-OxideSemiconductor ElectrodesWaterFilmsMechanismElectrolysisReductionOxidationBehaviorGaastext::journal::journal article::research article