Huang, GuanhaoLucas, ErwanLiu, JunqiuRaja, Arslan S.Lihachev, GrigoryGorodetsky, Michael L.Engelsen, Nils J.Kippenberg, Tobias J.2019-09-112019-09-112019-09-112019-01-0110.1364/CLEO_SI.2019.STh1H.3https://infoscience.epfl.ch/handle/20.500.14299/161060WOS:000482226301068Thermodynamic noises limit the frequency stability of resonators. Here, we present the first complete characterization of thermo-refractive noise in Si3N4 microresonators. The measurements are in good agreement with theoretical analysis and FEM simulation of the structures. (c) 2019 The Author(s)Engineering, Electrical & ElectronicOpticsPhysics, AppliedEngineeringOpticsPhysicstext::conference output::conference proceedings::conference paper