Descrovi, E.Sfez, T.Dominici, L.Nakagawa, W.Michelotti, F.Giorgis, F.Herzig, H. P.2009-04-222009-04-222009-04-22200810.1364/OE.16.005453https://infoscience.epfl.ch/handle/20.500.14299/38031We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a ∼ 102 near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations. © 2008 Optical Society of America.text::journal::journal article::research article