Spycher, RStadelmann, PABuffat, PAFlüeli, M2007-02-152007-02-152007-02-15198810.1002/jemt.1060100403https://infoscience.epfl.ch/handle/20.500.14299/2660WOS:A1988R722700002High-resolution electron microscopy image simulation on a Cray 1S/2300 computertext::journal::journal article::research article