Phase retrieval from integrated near-field diffraction intensity

Li, EnrongHwu, YeukuangChien, DavidWang, C. L.Margaritondo, G.2011-12-162011-12-162011-12-16201110.1088/2040-8978/13/3/035712https://infoscience.epfl.ch/handle/20.500.14299/74336WOS:000288598100034We discuss a near-field phase retrieval algorithm working with integrated diffraction intensity as well as a series of tests of its characteristics. Numerical simulations show improved performances compared to the previous algorithm.phase retrievalnear fieldoversamplingHard X-RaysReconstruction AlgorithmsImageMicroscopyObjectsPhase retrieval from integrated near-field diffraction intensitytext::journal::journal article::research article