Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protection

Li, ChengminSheng, JingDujic, Drazen2022-12-022022-12-022022-12-02202210.1109/TIE.2022.3224124https://infoscience.epfl.ch/handle/20.500.14299/192854Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protectiontext::journal::journal article::research article