Fluctuation Scaling in Nano-Interconnects and its Application to Electromigration

Beyne, SofieBeyne, Tim2019-08-222019-08-222019-08-22201910.5075/epfl-ICLAB-ICNF-269229https://infoscience.epfl.ch/handle/20.500.14299/160084Fluctuation Scaling in Nano-Interconnects and its Application to Electromigrationtext::conference output::conference paper not in proceedings