Villiger, MartinPache, ChristopheLasser, Theo2011-04-142011-04-142011-04-14201010.1364/OL.35.003489https://infoscience.epfl.ch/handle/20.500.14299/66415WOS:000283048100061Dark-field illumination is known to enhance scattering contrast in optical microscopy. We combined this concept with Fourier domain optical coherence microscopy (OCM). The detection and illumination paths are decoupled, and only the scattered light originating from the sample generates the tomogram signal, whereas any specular reflection is highly suppressed. We analyze and discuss this dark-field OCM concept and present its superior imaging quality on live cell samples.Instrumentation, measurement, and metrology : Scattering measurementsMedical optics and biotechnology : Cell analysisMicroscopy : Coherence tomographytext::journal::journal article::research article