Imaging of Optically Active Defects with Nanometer Resolution

Feng, JiandongDeschout, HendrikCaneva, SabinaHofmann, StephanLončarić, IvorLazić, PredragRadenovic, Aleksandra2018-02-252018-02-252018-02-252018-02-0210.1021/acs.nanolett.7b04819https://infoscience.epfl.ch/handle/20.500.14299/145008Imaging of Optically Active Defects with Nanometer Resolutiontext::journal::journal article::research article