Focused electron beam induced deposition of high resolution magnetic scanning probe tips

Utke, ICicoira, FJaenchen, GHoffmann, PScandella, LDwir, BKapon, ELaub, DBuffat, PAXanthopoulos, NMathieu, HJ2007-02-152007-02-152007-02-15200210.1557/PROC-706-Z9.24.1https://infoscience.epfl.ch/handle/20.500.14299/3054[NRG]Focused electron beam induced deposition of high resolution magnetic scanning probe tipstext::journal::journal article::research article