Kühn, JonasColomb, TristanPache, ChristopheCharrière, FlorianDepeursinge, Christian2009-07-202009-07-202009-07-20200810.1364/DH.2008.DTuC2https://infoscience.epfl.ch/handle/20.500.14299/41651Single-acquisition dual-wavelength digital holographic microscopy provides real-time phase measurement range over several microns. We demonstrate axial resolution enhancement down to sub-nanometer range thanks to the non- correlation between both available wavefronts.[MVD]HolographyImaging systemsMicroscopyDigital holographySub-Nanometer Resolution over Several Microns Range with Real-Time Dual- Wavelength Digital Holographic Microscopytext::conference output::conference proceedings::conference paper