Hefyene, N.Anghel, C.Gillon, R.Ionescu, A. M.2007-05-162007-05-162007-05-16200510.1109/RELPHY.2005.1493146https://infoscience.epfl.ch/handle/20.500.14299/6952Hot carrier degradation of lateral DMOS transistor capacitance and reliability issuestext::conference output::conference proceedings::conference paper