Reihl, B.Gimzewski, J. K.Schlittler, R.Tschudy, M.Berndt, R.Gaisch, R.Schneider, W. D.2007-06-202007-06-202007-06-20199410.1016/0921-4526(94)90199-6https://infoscience.epfl.ch/handle/20.500.14299/8882Low-Temperature Scanning-Tunneling-Microscopytext::journal::journal article::research article