Wyrsch, N.Goerlitzer, M.Beck, N.Meier, J.Shah, A.2009-02-102009-02-102009-02-10199610.1557/PROC-420-801https://infoscience.epfl.ch/handle/20.500.14299/34919Transport Properties of Compensated µc-Si:Htext::conference output::conference proceedings::conference paper