Villiger, M.Bachmann, A. H.Leutenegger, M.Steinmann, L.Lasser, T.Leitgeb, R. A.2008-02-272008-02-272008-02-272007https://infoscience.epfl.ch/handle/20.500.14299/19476Fourier Domain Optical Coherence Microscopy with extended depth of fieldtext::conference output::conference poster not in proceedings