Cevher, VolkanLi, Yen-huanBogunovic, IlijaBaldassarre, LucaScarlett, JonathanGözcü, Baran2017-05-022017-05-022017-05-022017https://infoscience.epfl.ch/handle/20.500.14299/137006The present invention concerns a method of sampling a test signal. The method comprises: acquiring (21) training signals sampled at a plurality of sampling locations; running (23) an optimization procedure for determining an index set of n indices, representing a subset of the sampling locations, that maximize a function, over the training signals, of a quality parameter representing how well a given training signal is represented by the n indices; and sampling (25) the test signal at the sampling locations represented by the n indices.patentUS10082551US201710965058523033