Battaglia, CorsinEscarré, JordiSöderström, KarinBoccard, M.Ballif, C.2012-04-272012-04-272012-04-27201210.1016/j.egypro.2012.02.024https://infoscience.epfl.ch/handle/20.500.14299/79754WOS:000306068100024We describe a method based on nanoimprinting and non-absorbing insulating silicon nitride electrodes for evaluating the light trapping potential of photonic nanostructures for thin-film silicon solar cells. We validate our method by relating the optical reflectance of the full solar cell stack to the external quantum efficiency of functional cells. Our method provides a useful experimental tool to compare different nanostructures circumventing complications arising from parasitic absorption and electrical cell performance.enLight trappinglight scatteringthin-film silicon solar cellsamorphous solar cellsmicromorph solar cellstransparenttransparent conducting oxideszinc oxideindium oxidefree carrier absorptionnanoimprintingExperimental Evaluation of the Light Trapping Potential of Optical Nanostructures for Thin-Film Silicon Solar Cellstext::journal::journal article::research article