Sirbu, AlexeiSuruceanu, G.Iakovlev, V.Mereuta, A.Mickovic, Z.Caliman, A.Kapon, E.2013-08-232013-08-232013-08-23201310.1109/LPT.2013.2271041https://infoscience.epfl.ch/handle/20.500.14299/94264WOS:000322341400004Wafer fusion vertical cavity surface emitting laser (VCSEL) technology has produced devices that successfully passed all mechanical and electrical Telcordia qualification tests. Accelerated lifetime tests result in times to 1% failure at 70 degrees C of 18 years and 30 years at VCSEL driving currents of 9 and 8 mA, respectively. These lifetimes meet the telecom industry reliability requirements for applications in fiber-optic communications networks.Fiber opticsoptical communicationReliability of 1310 nm Wafer Fused VCSELstext::journal::journal article::research article