Schaublin, RStadelmann, PA2007-02-152007-02-152007-02-15199310.1016/0921-5093(93)90696-Chttps://infoscience.epfl.ch/handle/20.500.14299/2798WOS:A1993LK05000060A method for simulating electron microscope dislocation imagestext::journal::journal article::research article