Characterization of Microwave Substrates for High Accuracy and Long-Term Stability Using Full-Wave Microstrip Ring Resonator Method

Su, YuanyanPellaton, MatthieuAffolderbach, ChristophMileti, GaetanoVeljovic, MiroslavSkrivervik, Anja2022-07-182022-07-182022-07-182021-01-0110.23919/EuMC50147.2022.9784190https://infoscience.epfl.ch/handle/20.500.14299/189260WOS:000819476100103An accurate material characterization method for microwave printed-circuit-board substrates is proposed by combining the microwave ring resonator method with iterative full-wave simulations. A detailed error analysis is performed quantitatively to compensate the discrepancy between the estimated value and the actual permittivity. The improved estimation accuracy is a necessity for some highly-precise microwave devices. In addition, the permittivity of FR4 substrate at 109 degrees C operating temperature as a function of time is investigated to validate its long-term stability.Engineering, Electrical & ElectronicTelecommunicationsEngineeringdielectric constantdissipation factorfr4-type substratesfull-wave methodloss factormaterial characterizationmaterial propertymicrostrip ring resonatormicrowave substratespermittivityprinted circuit boardprinted wire boardrubidium atomic clocktangential losswiring board materialsCharacterization of Microwave Substrates for High Accuracy and Long-Term Stability Using Full-Wave Microstrip Ring Resonator Methodtext::conference output::conference proceedings::conference paper