Stanisavljevic, MilosSchmid, AlexandreLeblebici, Yusuf2012-06-142012-06-142012-06-14201210.1002/9781118181508.ch18https://infoscience.epfl.ch/handle/20.500.14299/81862Reliability of Nanoelectronic VLSItext::book/monograph::book part or chapter