Hernandezramirez, F.Rodriguez, J.Casals, O.Russinyol, E.Vila, A.Romanorodriguez, A.Morante, J.Abid, M.2010-03-232010-03-232010-03-23200610.1016/j.snb.2006.04.022https://infoscience.epfl.ch/handle/20.500.14299/48527WOS:000241165800032Characterization of metal-oxide nanosensors fabricated with focused ion beam (FIB)text::journal::journal article::research article