Delacrétaz, YvesBoss, DanielLang, FlorianDepeursinge, Christian2010-11-012010-11-012010-11-01201010.1117/12.870742https://infoscience.epfl.ch/handle/20.500.14299/56494WOS:000287657900041In this communication we introduce a low or reduced coherence interferometry technique that can be used to retrieve surface topology on samples with high roughness. Moreover, we will show that the approach enables surface topology measurement also at the interface of so-called turbid media, where multiple scattering inside tissues can be a major issue, preventing accurate measurements.[MVD]text::conference output::conference proceedings::conference paper