Ante, FrederikKaelblein, DanielZaki, TarekZschieschang, UteTakimiya, KazuoIkeda, MasaakiSekitani, TsuyoshiSomeya, TakaoBurghartz, Joachim N.Kern, KlausKlauk, Hagen2012-02-232012-02-232012-02-23201210.1002/smll.201101677https://infoscience.epfl.ch/handle/20.500.14299/78056WOS:000298788800011organic thin-film transistorscontact lengthcontact resistancecutoff frequencyThin-Film TransistorsField-Effect TransistorsArtificial SkinPerformanceFabricationDielectricsMatrixContact Resistance and Megahertz Operation of Aggressively Scaled Organic Transistorstext::journal::journal article::research article