Chen, WPasquarello, A2018-11-082018-11-082018-11-08201810.1103/PhysRevLett.120.039603https://infoscience.epfl.ch/handle/20.500.14299/150000WOS:000423317300027Comment on "Fundamental Resolution of Difficulties in the Theory of Charged Point Defects in Semiconductors"text::journal::journal article::research article