Savona, V.Runge, E.Zimmermann, R.Haacke, S.Deveaud, B.2007-08-312007-08-312007-08-31200010.1002/1521-3951(200009)221:1<365::AID-PSSB365>3.0.CO;2-Ihttps://infoscience.epfl.ch/handle/20.500.14299/11370WOS:0000897880000642709The Rayleigh scattering of light at resonance with the ground state exciton transition in quantum wells is studied by means of a microscopic model. The disorder-induced localization of the exciton center-of-mass leads to characteristic features of the scattered intensity which can help understanding the outcome of secondary emission experiments. In particular, the connection between time-resolved scattering and energy-level statistics, and the enhancement of the backscattered intensity in angle-resolved measurements are discussed.RESONANT SECONDARY-EMISSIONCOHERENT BACKSCATTERINGWEAKLOCALIZATIONDISORDERED MEDIATIME EVOLUTIONEXCITONSLIGHTSYSTEMSTATESWeak LocalizationTheory of ultrafast Rayleigh scattering in semiconductor quantum wellstext::journal::journal article::research article